Advantages of CMOS for non-destructive testing (NDT)

Spectrum Logic has developed a range of X-ray detectors based on radiation hardened CMOS sensors for Industrial non-destructive testing with active area from 60 × 54 mm2 to 310 × 307 mm2, 50 and 100 μm pixel pitch.

CMOS X-ray detectors for NDT

They are ideally suited for industrial applications such as:

•          3D CBCT
•          casting and electronics inspection
•          metrology and material science
•          weld and pipeline inspection

What is non-destructive testing?

Non-destructive testing (NDT) (also known as non-destructive inspection (NDI) and non-destructive Evaluation (NDE) is a process by which manufacturers look to detect, analyse and measure hidden faults and flaws. This inspection process aims to test products without destroying them.  Using X-ray in NDT manufacturers are able to look for contaminants, defects and misaligned parts and are able to test and inspect connecting elements such as large metal castings, welded joints and assemblies without damaging or breaking the part being inspected.

As manufacturing has grown in scale so has the focus on product quality and safety.  Ensuring the validity of components in the automotive and aerospace industries is essential.  Failures in the field can be associated with enormous financial costs and damage to a manufacturer’s reputation. To prevent such problems  arising quality standards have become increasingly demanding calling for 100% inspection of all parts.

Why is CMOS a wise choice of detector technology for X-ray NDT?

HIGH SPEED IMAGING

Due to the high electron mobility of crystalline silicon and our high-speed electronics, Spectrum Logic CMOS detectors achieve high frame rate over the full active area and at full resolution, reaching frame rates of >100 fps at full resolution. Higher frame rates are possible in ROI modes. Our detectors are free of image lag generated in the sensor and electronics although scintillators do generate some afterglow.

 LOW NOISE AND HIGH RESOLUTION

Spectrum Logic’s proprietary active pixel sensor designs ensure low read noise and excellent image quality even at low signal levels. The technology permits small and large pixels to be designed from <15 μm to 150 μm.

 INNOVATIVE DESIGN

Our sensors employ radiation hard pixel designs, with adjustable saturation dose, allowing the sensor to be used for high or low radiation levels, making our detectors suitable for a wide range of industrial NDT applications.

HIGH IMAGE QUALITY

CMOS FPDs have a higher readout speed and lower noise than a-Si and IGZO due to the much higher electrical charge mobility in crystalline silicon and the CMOS active pixel sensor (APS) architecture. Due to the low noise level of CMOS, the low dose Detective Quantum Efficiency (DQE) is significantly improved and X-ray detection is achieved even at very low dose levels.

 LIFETIME DURABILITY

Our CMOS detector design has built-in radiation hardness both in the active pixel design and by virtue of the use of FOPs, which shield and protect the sensors and electronics. This design significantly improves the product reliability and enables a long operating life. For a superior image quality with high resolution for non-destructive testing imaging, CMOS (complementary metal-oxide semiconductor) flat panel detector.

AUTOMATIC EXPOSURE DETECTION

Spectrum Logic has developed advanced automatic exposure detection which is made possible by the CMOS active pixel technology used. The advanced, highly sensitive AED uses the entire sensor active area and responds to the onset of X-ray flux in 15 ms. Thanks to the low noise sensor and electronics, false triggers do not occur.

Why choose Spectrum Logic CMOS X-ray detectors?

KEY FEATURES:

• Broad product portfolio: active area from 60 × 54 mm mm2 to 310 × 307 mm2, 50 μm and 100 μm pixel pitch

• Fibre Optic Plate (FOP) – protects the sensor from radiation damage and reduces noise

• Rad hard image sensor design

• High frame rates

• Automatic Exposure Detection (AED)

• Lower noise than aSi, IGZO or passive pixel CMOS

• Dual gain modes

• ROI modes with increased frame rates

• Scintillator can be customised to optimise the detector for the customer’s application

• No measurable image lag from CMOS sensor

• 5 GigE available, 10 GigE 1Q 2023

Case Study:  Cabinet NDT

Electronics Inspection - Ball Grid Arrays

CMOS detectors offer small pixel size for higher spatial resolution to detect small features – such as broken wires and ball grid array defects.  CMOS detectors have low image lag for a clearer image whether in real-time radiography or CT reconstruction. They also offer fast frame rates  which are useful for inline inspection e.g. inline battery CT where high through-put is important. 

Battery Inspection

CASE STUDY:  Portable NDT: Heat Exchanger Inspection

Spectrum Logic has developed a thin 15010HS detector which has an industry leading thickness of 9mm, making it ideal for imaging hard to access objects such as heat exchangers. 

To see the full portfolio download our CMOS X-ray detectors for NDT here or contact us for further information.