LONDON, UK – Spectrum Logic is proud to announce the official release of the 1615HR, a state-of-the-art CMOS X-ray detector engineered to meet the rigorous demands of high-speed electronics and semiconductor inspection. By combining ultra-high resolution with industry-leading frame rates, the 1615HR provides a robust solution for Automated X-ray Inspection (AXI), inline CT, and critical quality control.
CMOS sensors excel at capturing visible light but require a "translator" for high-energy radiation. This deep dive explores how scintillators bridge that gap in X-ray imaging. We compare the high-resolution columnar structure of Caesium Iodide (CsI) against the rugged efficiency of Gadox (Gd2O2S), explaining how material choice, thickness, and MTF (Modulation Transfer Function) directly impact image clarity, patient safety, and industrial precision in 2026.
1615HE is a high-speed yet cost effective product that offers a balance between resolution and sensitivity. It promises to meet the high bandwidth requirements for in-line inspection of electronics and semiconductors.
The Spectrum Logic 1615HE is a dynamic X-ray detector designed specifically for electronics inspection, industrial NDT and scientific applications, with a pixel pitch of 75 μm and high efficiency CsI scintillator options. It is well suited to real-time/Inline CT and AXI.
CT systems that are able to image tiny features of a few tens of microns are called micro-CT scanners. In recent years, advances in CMOS X-ray detectors have enabled the development of compact benchtop micro-CT scanners with the capability to image features smaller than 1 micrometre in short duration scans. Find out more …
