1615HE is a high-speed yet cost effective product that offers a balance between resolution and sensitivity. It promises to meet the high bandwidth requirements for in-line inspection of electronics and semiconductors.
The Spectrum Logic 1615HE is a dynamic X-ray detector designed specifically for electronics inspection, industrial NDT and scientific applications, with a pixel pitch of 75 μm and high efficiency CsI scintillator options. It is well suited to real-time/Inline CT and AXI.
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CT systems that are able to image tiny features of a few tens of microns are called micro-CT scanners. In recent years, advances in CMOS X-ray detectors have enabled the development of compact benchtop micro-CT scanners with the capability to image features smaller than 1 micrometre in short duration scans. Find out more …
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Spectrum Logic detectors for Synchrotrons will be on display at the 38th Annual Meeting of the Synchrotron Radiation Society of Japan and Joint Symposium on Synchrotron Radiation Science held on 10-12 January 2025 at Tsukuba International Conference Center, Tsukuba City, Ibaraki Prefecture.
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World Radiography Day (WRD) is observed annually on November 8th to honour the groundbreaking discovery of X-rays by Wilhelm Conrad Röntgen in 1895. The day, first celebrated in 2007 by the International Society of Radiographers and Radiological Technologists (ISRRT), has become a global event. In 2012, the European Society of Radiology (ESR), the Radiological Society of North America (RSNA) and the American College of Radiology (ACR) came together to coordinate the first major celebration of the day.
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