“You can tell so much about the basic composition of a material by looking at its diffraction pattern” Proffessor Nigel Allinson MBE. Distinguished Professor of Image Engineering. University of Lincoln and one of the founders of ISDI. X-ray Crystallography is a scientific technique which owes much of its development to the work of Lawrence Bragg.
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Thalis Anaxagoras, Asmar Khan and Ed Bullard at iCT 2025
Thank you to everyone who came to visit us at iCT 2025 (the14th International Conference for Industrial Computed Tomography) hosted by Antwerp University.
Spectrum Logic was a gold sponsor and exhibited at iCT 2025. This conference was a great opportunity to meet with researchers and experts from academia, industry and research institutions, all of whom share an interest in advancing research and innovation in the field of X-ray computed tomography.
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Micro-CT image of a Dung Beetle
CT systems that are able to image tiny features of a few tens of microns are called micro-CT scanners. In recent years, advances in CMOS X-ray detectors have enabled the development of compact benchtop micro-CT scanners with the capability to image features smaller than 1 micrometre in short duration scans. Find out more …
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Spectrum Logic Hall 3 booth # 3414
The Spectrum Logic team are exhibiting at Control 2025 - the international trade fair for quality assurance (6-9 May 2025) at Messe Stuttgart, Germany.
We will be showcasing our cutting-edge, high-resolution, high-speed CMOS X-ray detectors designed for non-destructive testing (NDT) and quality assurance (QA). These detectors are essential components of inline quality control systems and automated X-ray inspection (AXI) systems used worldwide.
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