Next-Generation Inspection: 6060XR Extra Resolution Detector*
Many of our customers are pursuing 100% inline inspection for semiconductor packaging. The challenge is speed: CT scans of dense, miniature components such as chips and multi-layer ceramic capacitors (MLCCs) can take up to 10 minutes per part, making inline inspection impractical.
The solution is a detector that combines ultra-high resolution with high efficiency to enable much faster scanning. To meet this need, Spectrum Logic is developing the 6060XR (Extra Resolution) 10 µm CMOS Detector.
Read MoreSpectrum Logic will be a gold sponsor at iCT Conference 2026 between 10th to 13th February 2026 at FH Oesterrich University of Applied Sciences. Venue: Campus Linz, Garnisonstraße 21, 4020 Linz.
This conference brings together researchers and experts from academia, industry and research institutions, all of whom share an interest in advancing research and innovation in the field of Industrial X-ray Computed Tomography.
Read MoreSpectrum Logic has developed CMOS X-ray detectors designed for semiconductor packaging, where devices and sensors are integrated into compact architectures to improve performance and efficiency. Examples include graphics processing units (GPUs), high bandwidth memory (HBM) and multi-layer ceramic capacitors (MLCCs)—a type of surface-mount capacitor that also serves as a semiconductor package.
Read More“You can tell so much about the basic composition of a material by looking at its diffraction pattern” Proffessor Nigel Allinson MBE. Distinguished Professor of Image Engineering. University of Lincoln and one of the founders of ISDI. X-ray Crystallography is a scientific technique which owes much of its development to the work of Lawrence Bragg.
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