1615HE is a high-speed yet cost effective product that offers a balance between resolution and sensitivity. It promises to meet the high bandwidth requirements for in-line inspection of electronics and semiconductors.
The Spectrum Logic 1615HE is a dynamic X-ray detector designed specifically for electronics inspection, industrial NDT and scientific applications, with a pixel pitch of 75 μm and high efficiency CsI scintillator options. It is well suited to real-time/Inline CT and AXI.
Read MoreSpectrum Logic will exhibit with ISDI and Tichawa Vision at Semicon Europa 2025 and will be promoting our solutions for Semiconductor Inspection at the exhibition.
Read MoreNext-Generation Inspection: 6060XR Extra Resolution Detector*
Many of our customers are pursuing 100% inline inspection for semiconductor packaging. The challenge is speed: CT scans of dense, miniature components such as chips and multi-layer ceramic capacitors (MLCCs) can take up to 10 minutes per part, making inline inspection impractical.
The solution is a detector that combines ultra-high resolution with high efficiency to enable much faster scanning. To meet this need, Spectrum Logic is developing the 6060XR (Extra Resolution) 10 µm CMOS Detector.
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iCT 2026 to be held at University of Applied Sciences, Upper Austria
Spectrum Logic will be a gold sponsor at iCT Conference 2026 between 10th to 13th February 2026 at FH Oesterrich University of Applied Sciences. Venue: Campus Linz, Garnisonstraße 21, 4020 Linz.
This conference brings together researchers and experts from academia, industry and research institutions, all of whom share an interest in advancing research and innovation in the field of Industrial X-ray Computed Tomography.
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