Spectrum Logic will exhibit with ISDI and Tichawa Vision at Semicon Europa 2025 and will be promoting our solutions for Semiconductor Inspection at the exhibition.
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Next-Generation Inspection: 6060XR Extra Resolution Detector*
Next-Generation Inspection: 6060XR Extra Resolution Detector*
Many of our customers are pursuing 100% inline inspection for semiconductor packaging. The challenge is speed: CT scans of dense, miniature components such as chips and multi-layer ceramic capacitors (MLCCs) can take up to 10 minutes per part, making inline inspection impractical.
The solution is a detector that combines ultra-high resolution with high efficiency to enable much faster scanning. To meet this need, Spectrum Logic is developing the 6060XR (Extra Resolution) 10 µm CMOS Detector.
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iCT 2026 to be held at University of Applied Sciences, Upper Austria
Spectrum Logic to exhibit and sponsor iCT 2026 in Austria
Spectrum Logic will be a gold sponsor at iCT Conference 2026 between 10th to 13th February 2026 at FH Oesterrich University of Applied Sciences. Venue: Campus Linz, Garnisonstraße 21, 4020 Linz.
This conference brings together researchers and experts from academia, industry and research institutions, all of whom share an interest in advancing research and innovation in the field of Industrial X-ray Computed Tomography.
Read MoreSpectrum Logic Detectors for Advanced Packaging Applications - Semiconductors
Spectrum Logic has developed CMOS X-ray detectors designed for semiconductor packaging, where devices and sensors are integrated into compact architectures to improve performance and efficiency. Examples include graphics processing units (GPUs), high bandwidth memory (HBM) and multi-layer ceramic capacitors (MLCCs)—a type of surface-mount capacitor that also serves as a semiconductor package.
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