Next-Generation Inspection: 6060XR Extra Resolution Detector*
Many of our customers are pursuing 100% inline inspection for semiconductor packaging. The challenge is speed: CT scans of dense, miniature components such as chips and multi-layer ceramic capacitors (MLCCs) can take up to 10 minutes per part, making inline inspection impractical.
The solution is a detector that combines ultra-high resolution with high efficiency to enable much faster scanning. To meet this need, Spectrum Logic is developing the 6060XR (Extra Resolution) 10 µm CMOS Detector.
Read MoreSpectrum Logic will be a gold sponsor at iCT Conference 2026 between 10th to 13th February 2026 at FH Oesterrich University of Applied Sciences. Venue: Campus Linz, Garnisonstraße 21, 4020 Linz.
This conference brings together researchers and experts from academia, industry and research institutions, all of whom share an interest in advancing research and innovation in the field of Industrial X-ray Computed Tomography.
Read MoreThank you to everyone who came to visit us at iCT 2025 (the14th International Conference for Industrial Computed Tomography) hosted by Antwerp University.
Spectrum Logic was a gold sponsor and exhibited at iCT 2025. This conference was a great opportunity to meet with researchers and experts from academia, industry and research institutions, all of whom share an interest in advancing research and innovation in the field of X-ray computed tomography.
Read MoreCT systems that are able to image tiny features of a few tens of microns are called micro-CT scanners. In recent years, advances in CMOS X-ray detectors have enabled the development of compact benchtop micro-CT scanners with the capability to image features smaller than 1 micrometre in short duration scans. Find out more …
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