Next-Generation Inspection: 6060XR Extra Resolution Detector*

Many of our customers are pursuing 100% inline inspection for semiconductor packaging. The challenge is speed: CT scans of dense, miniature components such as chips and multi-layer ceramic capacitors (MLCCs) can take up to 10 minutes per part, making inline inspection impractical.

The solution is a detector that combines ultra-high resolution with high efficiency to enable much faster scanning. To meet this need, Spectrum Logic is developing the 6060XR (Extra Resolution) 10 µm CMOS Detector.