One of the main areas of growth for Spectrum Logic is the global automated X-ray inspection (AXI) market. AXI is a growing market driven by advances in semiconductor packaging, AI chips, electric vehicles and aerospace. Within AXI we have been focusing on inline electronics inspection. Inline electronics inspection is a fully automated X-ray inspection (AXI) process, which uses 2D X-ray or 3D computed tomography (CT) to rapidly, non-destructively, inspect parts as they are being manufactured. It can be used to inspect:
- electronic components
- printed circuit boards (PCBs)
- EV battery cells
- power module units
- semiconductor components
Read MoreSpectrum Logic will be exhibiting at the 12th Japan Inspection Instruments Manufacturers' Show (JIMA) at Tokyo Big Sight 18th-20th September. This exhibition is organised by the Japan Inspection Instruments Manufacturers' Association, is the leading exhibition for industrial NDT and AXI in Japan. It features key players in the X-ray inspection industry showcasing the latest advances in X-ray technology and other inspection methods.
Read MoreThe Spectrum Logic/ISDI team worked with UCL on a study which has just been published in Journal of Applied Physics ‘Design and fabrication of a sandwich detector for material discrimination and contrast cancellation in dual-energy based X-ray imaging’ . The team developed a ‘Sandwich Detector’ which consists of two detectors one placed on top of the other and can be used for dual-energy imaging.
Read MoreCelebrating Rosalind Franklin's Contribution to the Discovery of DNA's Structure
Rosalind Franklin was a pioneering British biophysicist and X-ray crystallographer born on July 25, 1920, in London. She played a crucial role in understanding the molecular structures of DNA, RNA, viruses, coal, and graphite. Excelling in science from a young age, she earned her Ph.D. from the University of Cambridge. Franklin is best known for her pivotal contributions to the discovery of DNA's double helix structure during her tenure at King's College London in the early 1950s. Her meticulous X-ray diffraction work led to the capture of Photograph 51, an image that provided critical evidence of DNA's helical structure.
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