At iCT Conference 2026 , in FH Oberösterreich University of Applied Sciences, Linz Austria, Spectrum Logic launched a new product: 1515HR for Industrial Inspection and Quality Control – with a focus on AXI (Automated X-ray Inspection) and CT (Computed Tomography).
3D CT of a PCB (printed circuit board)
The iCT 2026 conference provides a forum for academics, researchers, industry and scientists, from the world of Industrial X-ray Computed Tomography and proved to be the ideal event to launch our latest new product release:
1515HR: High-Speed, High-Resolution X-Ray Imaging with Built-In Radiation Protection *
1515HR CMOS X-ray detector - click on image for more views
Pixel pitch 50 µm
Resolution 3002 x 3000
Active area 150.5 x 150.15mm
Frame rate max 60 fps
ADC resolution 16bit
Interface 10GigE
“The 1515HR is a continuation of our vision to offer high-speed, high-resolution X-ray imaging for industrial market. We're excited to introduce an enhanced version of our best-selling 1412HR (50 µm) model, now offering a 25% larger imaging area (15 x 15 cm) with a superior frame rate of 60 fps to meet the needs of our most demanding applications, like in-line CT of electronics and semiconductor inspection.”
Asmar Khan, General Manager at Spectrum Logic.
The 1515HR comes with a new radiation tolerant mechanical enclosure, removing the need for external shielding. Offering fast and easy integration with better radiation protection, which in turn enhances the lifetime of the detector.
1515HR internal radiation shielding
This development marks a significant step forward in inspection technology, ensuring that users can achieve optimal results in a timely manner. *Samples will be available in Q2 2026.
Dr Asmar Khan gave a presentation on ‘Real-Time CMOS X-ray Detectors for Next Generation In-line Semiconductor Inspection’ at iCT 2026 which we will soon be sharing on our blog.
Dr Asmar Khan presenting at iCT 2026
At iCT 2026 we were grateful to meet customers and competitors and to share information with experts, using CT in a number of different applications, ranging from:
- Non-Destructive Evaluation: Testing of metals, plastics, composites, and ceramics without causing any damage.
- Sector-Specific Inspections: Comprehensive assessments in automotive, aerospace, and materials industries.
- Innovative Material Analysis: Examination of new materials and components for cutting-edge applications.
- Three-Dimensional Material Profiling: Advanced characterization techniques for in-depth material analysis.
- CT Imaging at Various Scales: Macro, micro, and nano computed tomography for diverse applications.
- Reverse Engineering and Sampling: Techniques for deconstructing and analysing existing components.
- Advanced Synchrotron CT Techniques: Utilizing synchrotron radiation for high-resolution imaging.
- Breakthroughs in X-Ray Technology: The latest advancements in X-ray detectors and sources driving innovation.
Contact us on inquiries@spectrumlogic.com if you want any further information about our products for your application.